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| EDA Conversion Tools to be Integrated with FLEX Platform's IG-XL Teradyne has announced the availability of test development tools from Test Insight for quick and seamless conversion of EDA digital test patterns for use on FLEX test platform systems. The OpenFLEX open-architecture environment provides transparent integration of the Test Insight software tool suite within the FLEX platform's IG-XL operating software. The Test Insight tools allow simulator output produced by today's leading ATPG tools, such as Mentor Graphics Fast Scan and Synopsis TetraMAX, to be reused on all FLEX family systems. New customers of IG-XL program development software seats will receive a free node locked license for a 90-day trial period. The Test Insight tool suite includes WaveWizard, ScanConverter and HDLLink, providing for the conversion of STIL, WGL, VCD and EVCD formatted digital patterns from EDA environments to the IG-XL test operating software. WaveWizard provides automatic pattern conversion capability to generate test programs from design simulation data. The ScanConverter software tool converts WGL or STIL based scan tests into tester formatted patterns and timing. The HDLLink test program simulation and debug environment can create a Verilog testbench for WaveWizard projects to support the simulation and debug of devices. write your comments about the article :: © 2006 Computing News :: home page |