|
contents | america | ||||
| 24th Teradyne Users Group Technical Conference Teradyne announced the 24th Teradyne Users Group Technical Conference will be held April 23-25, 2007 at the Sheraton Universal Hotel in Hollywood, California. TUG is the test industry's longest running customer user group conference. Technical papers at TUG 2007 will cover a range of test topics, including instrument calibration, characterization, test efficiency, data analysis, test development and debug, and test time reduction. A new addition at the 2007 TUG Conference is the Sunday Seminar series. The 2-3 hour long educational seminars will be held on Sunday, April 22, 2007, the day before the technical conference begins. Seminars will include a "POP Workshop" looking at techniques for Pattern Oriented Programming with IG-XL for Teradyne's FLEX Test Platform, and an "Introduction to VLSI Testing and Design Testability" covering algorithms and techniques that are implemented in various EDA tools. This year's Semiconductor Program is a full 3 days, and the Mil/Aero Program will run for 2 days. Various companies providing products and services that interface with Teradyne systems will again exhibit at a vendor fair session during the conference and share their information with attendees. write your comments about the article :: © 2007 Exhibition News :: home page |