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| 2007 IEEE International Reliability Physics Symposium The IEEE International Reliability Physics Symposium's (IRPS) 45th annual conference returns to Phoenix, Ariz., from April 15 through April 19, 2007, at the new Phoenix Convention Center in conjunction with the Hyatt Regency. The focus of the symposium is the three-day technical program featuring original work that identifies new microelectronic failure or degradation mechanisms, improves understanding of known failure mechanisms, demonstrates new or innovative analytical techniques, or demonstrates ways to build-in reliability. New this year are emphases on reliability and qualification issues for microelectronics in extreme environments, e.g. automotive/high temperature, avionics, and/or radiation/space environments and reliability and drift phenomenon in organic-based electronic devices, including Organic Light Emitting Diodes and Organic Thin Film Transistors. Additionally, attendees can participate in the two-day tutorial program, which provides opportunity to learn a new area in some technical depth from industry experts, as well as catch up with important work published from the previous year in key reliability areas with the Reliability Year-In-Review Seminar. The symposium also presents manufacturing companies with an ever-expanding forum for hands-on demonstrations of the latest manufacturing equipment to leading engineers and researchers in the microelectronics industry. write your comments about the article :: © 2006 Exhibition News :: home page |