![]() |
contents | technologies | |||||||||
| Leading technology for quality control of solar wafers ![]() Today, around 80 percent of all solar wafers worldwide are inspected by Hennecke systems. Optimized uptime, highest throughput and improved test quality set a new benchmark for performance and productivity. The WIS-08 examines micro-cracks, inclusions, saw marks, defective edges, thickness variation and other parameters of the silicon wafers for the photovoltaic industry with exacting precision and sorts them into quality classes. Transflection technology is also a standard feature in the WIS-08 and the InGaAs cameras can detect even the smallest μ-cracks. The next generation WIS-08 is compatible with diamond wire and slurry cut wafers and can be quickly and easily adjusted to all wafer formats and sizes. In addition to the stability and quality of the tests and low breakage rate, the system delivers the highest throughput on the market at 8, 000 wafers per hour or 0.41 seconds per wafer. By combining test reliability, quality and speed with customer-specific upgrades, the modular WIS-08 is setting the market standard as a stable, profitable solution for the quality control of solar wafers. write your comments about the article :: © 2018 Construction News :: home page |