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| New Phasor XS from GE The new Phasor XS from GE Inspection Technologies brings phased array flaw-imaging capability to everyday inspection in an easy-to-use, portable and affordable ultrasonic flaw detector, which will reduce inspection times and improve probability of detection. It is suitable for industrial and process spectra, in aerospace, oil & gas, power generation, the automotive sector and general engineering, wherever there is a need for fast, accurate and reliable inspection of welds, pipework, pressure vessels or structural fabrications. When used in phased array mode, the instrument offers up to 64 individual channels and the operator can electronically multiplex a multi-element probe to achieve precise control over the angle of inspection, the amplitude and the depth of focus of each individual ultrasonic beam. The inspection image is presented as a full colour, sector B-scan on the unit's high resolution TFT screen, providing comprehensive data in real time. Any of the A-scans which make up the sector scan can be selected for separate display or for simultaneous display with the sector image to allow instant and reliable sizing. Sector images and A-scans can be stored on a removable SD card for off-line data analysis and management. A wide range of array probes are compatible with the new flaw detector, including dialog probes, containing probe identification data which can be transmitted back to the instrument to ensure increased inspection reliability, minimise set-up errors and assist in probe operation calculations. In conventional mode, the Phasor XS can use standard ultrasonic probes to carry out conventional inspection, including corrosion and thickness measurement. Ruggedly packaged and weighing less than 4 kg, the Phasor XS offers an ideal entry-level phased array solution to manual volumetric inspections in a wide range of applications. write your comments about the article :: © 2006 Construction News :: home page |