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New infrared Imaging System for Low-Emissivity glass

Raytek announces the GS110 Process Imaging System for Low Emissivity, Low-E, glass. This system was specifically designed to monitor one-side coated flat glass.

By design, Low-E glass has very low emissivity, which presents a significant challenge to the process engineer. Simply scanning from the topside of the glass will provide erroneous readings, as the correct emissivity will not be factored into the temperature determination. With the addition of an IR point sensor to measure the temperature on the uncoated side of the glass where the emissivity is both known and significantly higher, the Raytek GS110 can automatically correct the thermal image and provide an accurate result.

By quickly detecting thermal irregularities within the glass and identifying defective heating elements, the Raytek GS110 allows to improve product quality and uniformity, and to reduce scrap. If a fault or defect occurs, an alarm is triggered to allow for corrective action. The Raytek GS110 system allows the user to set-up predefined recipes to accommodate frequent product changes involving glass parts of differing size, thickness and coating typical in glass processes.

The GS110 can be used for non-contact infrared temperature measurement in other secondary glass-processing applications such as bending, forming, and annealing. The new system features an automatic correction mode that adjusts the system to accommodate changes in emissivity due to different glass types or coatings and provides accurate two-dimensional thermal images of low-emissivity glass.

The Raytek GS110 can be simply integrated into a complete process control system through the use of available analog or digital output modules. An OPC server is included as an integral part of the proprietary software allowing for seamless integration of the data into other process control software packages. An automatic database function is provided to facilitate continuous documentation of product quality. The data is stored as a profile or thermal image to be archived and printed for subsequent analysis as necessary.



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