2007 Advanced Materials/Failure Analysis (AMFA) Workshop Meets
The Advanced Materials/Failure Analysis (AMFA) Workshop, which provides a forum for the discussion of current issues and trends in the microelectronics industry with leading experts, will meet April 20, 2007, at the Hyatt Regency Phoenix at Civic Plaza in Phoenix, Ariz.
AMFA's mission is to serve the interests of failure analysis and materials characterization professionals by providing a forum for the presentation and active discussion of timely and pertinent technological issues and trends and to promote the development of new capabilities that fill critical gaps in emerging technologies. Unlike traditional conferences that often restrict audience participation, AMFA Workshops provide only top quality invited speakers on leading edge topics in a format where audience participation is expected and strongly encouraged.
AMFA programs and speakers this year will include FA Role: Dynamic Driver or Passive Passenger?: Rich Blish, Spansion; Efrat Raz, Gemtech; Leveraging Federal Funding for Characterization Tools; Advances in Terahertz Imaging; Metrology for Emerging Devices and Materials; Atomic Level Ion Source Microscopy; Materials Characterization Using Ultrafast Lasers; Failure Analysis Year in Review.
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