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SUSS MicroTec Announces SussCal Professional

SUSS MicroTec AG announces the release of the newest version of its renowned wafer-level, high-frequency calibration software. SussCal Professional simplifies the wafer-level calibration process and significantly increases the accuracy of on-wafer measurements. Wireless communications are playing a larger role in everyday life; data transfer rates, broadband communication channels, and carrier frequencies are increasing rapidly. Furthermore, technology has advanced so much that traditional DC measurements for device characterization are no longer sufficient. As a result, the industry is required to do far more RF and microwave testing.

SussCal Professional is the cornerstone of accurate, on-wafer measurements, guaranteeing excellent wafer-level calibration time after time. The VNA, cables and wafer probes are calibrated using a set of well-defined standards to eliminate systematic error, moving the reference plane of the measurement to the device under test (DUT). SussCal Professional simplifies this calibration by using an intuitive, top-down process to guide the user through the entire set-up, from system settings to standard assignment. It also includes powerful features like the PortMapping technology for easy set-up of complicated multiport calibration.

For the most accurate measurements from DC to 110 GHz and beyond, SussCal Professional includes the SUSS LRM+ calibration method. LRM+ also eliminates the need for de-embedding, a process that wastes valuable space on a wafer. SussCal Professional is highly repeatable and automates the calibration process when using a semiautomatic or fully automated probe system. This means that production floor testing of RF devices is now easy to set up and monitor.



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